Testing Effect of Noise & Spurs on Vcc of a PLL/VCO integrated circuit

Broadcasted 7/17/2014

In this short video clip we show how a designer or verification engineer can easily test effects of noise and spurs riding on the Vcc of their PLL/VCO circuit. We baseline the PLL/VCO phase noise performance with no noise (AWGN) or spurs (CW tones) injected. We then introduce broadband noise to the Vcc and repeat phase noise measurements to see impact of AWGN. The measurements are repeated for 10 KHz, 100 KHz, 1 MHz and 10 MHz CW tones. The test set-up consists of a clean power supply, JV9000 noise on Vcc test solution, PLL/VCO eval board (DUT) and a phase noise analyzer (BNC model 7300). The simplicity of the testing shown in this video highlights the advantages of using an integrated solution like JV9000 where a noise generator, a CW signal generator and combiners, attenuators and bias-t are all integrated into one box allowing noise immunity testing within minutes.