Wireless Telecom Group, Inc., a global designer and manufacturer of radio frequency (RF) and microwave-based products and test equipment for civilian and military radar and communications applications and industries announced it was recognized as a 4-star supplier for operational excellence by Raytheon for 2014.

Noisecom simplifies Satellite Modem BER vs. Eb/No testing with its family of Programmable Precision Eb/No Generators.

Noisecom's CNG-EbNo is a fully automated precision Eb/No generator that sets a highly accurate ratio between a user-supplied carrier and internally generated noise over a wide range of signal power levels and frequencies. The CNG-EbNo gives system, design, and test engineers in the satellite and military communication industries a cost-effective means of obtaining higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Satellite applications include military communications, SATCOM, L-band, Milstar, Inmarsat and Intelsat. A fully calibrated high dynamic range power meter allows the CNG-EbNo to set the desired Eb/No ratio to within ±0.2 dB. Special configurations can provide improved accuracy. Dual band units as well as custom frequencies and configurations are available.

The supply voltage (Vcc) specification is a key parameter for almost all integrated circuits’ (IC) datasheets. Unless its requirements are met there is no way to know if the remaining IC specifications will be valid. Therefore before specifying the operational supply voltage range of a device, designers, verification and quality engineers use the results of extensive testing to make sure the IC meets all the specification requirements within the tested Vcc voltage range. With the exception of the power supply rejection ratio (PSRR) specification of some analog and RF ICs, what is often not specified or ignored is the immunity of the IC to noise and spurs riding on its supply voltage.

Communication devices and other electronic equipment use a variety of active devices including digital and analog ICs.  Increased data clock rates and densely packed active components create an ideal environment for electromagnetic interference (EMI) as well as create ground bounce and Vcc droop.  This interference contributes to jitter and timing problems within the integrated circuits and its impact on performance is difficult to model using simulations therefore it needs to be verified early in the design cycle.  Noisecom JV9000 generates random noise (AWGN) and deterministic (CW) signals and injects them to the power supply (Vcc) in a controlled fashion to allow the user to test their device, circuit or system performance against noise on Vcc.

Visit us at Satellite Show in Washington, DC from March 19-21, booth# 3106 and get a sneak peak at our New Boonton Product, the 55 Series Wideband USB Power Sensor.

Visit us at DesignCon Show in Santa Clara, CA from January 29 - 30, booth# 726  to see the new JV9000A demo, our latest addition to the Jitter series generators.

Noisecom, a Wireless Telecom Group company (NYSE: WTT), has launched its new JV9000 series, a family of Programmable  and Adjustable VCC Noise and Spur Generators.

Noisecom has launched its new JV9000 series, a family of Adjustable VCC Noise Generators.

Modern integrated circuits contain billions of transistors that require complex power distribution systems. This power distribution complexity combined with inexpensive switch-mode power supplies creates several sources of noise found on the power and ground planes of a PC circuit board. This interference is difficult to model using software and contributes to jitter timing problems within the IC. The Noisecom JV9000A is designed to generate random and deterministic noise on the power and ground planes to emulate this behavior. The webinar illustrates how the JV9000A can be used to generate these effects in real systems.

A noise source that produces white noise is essentially an inexpensive broadband signal generator with an extremely flat (constant) power density output versus frequency. Noise sources are almost insensitive to temperature and supply voltage variations. Noise sources are therefore used for Built-in Testing (BIT), Fault Isolation Testing (FIT), and calibration in communication and radar warning systems to ensure the reliability and performance of the link. The webinar will be about the discussion of noise relevant parameters and applications.

Serial data systems play an increasingly important role whenever volumes of data are processed or transported. Jitter is a key concern for engineers developing high speed components such as transmitters, receivers and data channels. Serial high speed communication systems need to operate within very tight margins; with data provided extremely fast and with an exceptionally low probability of errors.